Forevision Instruments solutions for Nano-Technology & Microscopy


Material Research AFM

Bruker Surface and Dimensional Analysis Products

Atomic Force Microscopes

High-Resolution AFM Systems Powered by PeakForce Tapping

The push for discovery and understanding has often been the catalyst to Bruker’s development of new and relevant capabilities for the materials research community. Our latest AFM advances are no exception. We are enabling researchers to map and quantify elastic and viscoelastic properties, nanoscale conductivity, local electrochemical activity, and more — while simultaneously imaging sample topography at atomic scale resolution. Utilizing PeakForce Tapping®, FASTForce Volume, and exclusive probes technology, Bruker’s large-sample and small-sample AFM have an unmatched track record of helping scientists discover, understand, and publish in new, high-impact areas of science.

The Best Value AFM