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Home /NT-MDT Spectrum Instruments/ AFM and AFM – Raman / SNOM / IR / ATOMIC FORCE MICROSCOPES
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For many years, specialists of NT-MDT LLC (Moscow) and all employees of the NT-MDT Spectrum Instruments group of companies have been involved in the development, production and support of research equipment, primarily atomic force microscopes (AFM) and their combinations with ultra-high resolution spectroscopy. NT-MDT's pioneering efforts have resulted in an impressive combination of scanning probe microscopy with Raman spectroscopy and advanced optical microscopy techniques.

  • 30+ years of experience in Scanning Probe Microscope (SPM) market
  • Installed over 4000 tools in 59 countries
  • 30+ worldwide distributors

ND-MDT MISSION

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Professor Victor Bykov
NT-MDT Founder and General Manager

To enable scientists to conduct nanoscale research by creating advanced instruments for nanotechnology

GLOBAL PRESENTATION

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NT-MDT
Head Office
Moscow, Russia
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NT-MDT America
Tempe AZ, USA
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NT-MDT
Shanghai and Beijing,
China
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Spectrum Instruments
Limerick, Ireland
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ATOMIC FORCE MICROSCOPES

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SOLVER NANO

  • Compact desktop AFM/STM for both education and science.
  • Full set of AFM/STM modes
  • High AFM/STM performance.
  • Closed-loop Scanner.
Overview product
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NEXT II

  • AFM/STM with exceptional level of automation.
  • Fast, precise and low-noise closed-loop scanner.
  • High resolution imaging due to extremely low noise and high stability.
  • Full set of standard and advanced AFM/STM modes.
  • HybriD ModeTM
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NTEGRA II

  • Modular high performance AFM/STM for wide range of applications.
  • Low noise and high resolution.
  • Full set of standard and advanced AFM/STM modes.
  • HybriD ModeTM.
Overview product
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VEGA

  • Automated high-resolution AFM for up to 200x200 mm samples.
  • Ultra stable AFM.
  • Full set of standard and advanced AFM modes.
  • HybriD ModeTM.
  • ScanTronicTM.
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AFM – Raman / SNOM / IR and s-SNOM

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NTEGRA SPECTRA II

  • SPM.
  • Automated AFM laser, probe and photodiode.
  • Confocal Raman / Fluorescence / Rayleigh Microscopy.
  • Tip Enhanced Raman Scattering (TERS).
  • TERS optimized system for all possible excitation/detection geometries.
  • HybriD ModeTM.
Overview product
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NTEGRA NANO IR

  • IR s‑SNOM microscopy and spectroscopy with 10 nm spatial resolution.
  • High resolution AFM.
  • Stabilized CO2 laser.
  • HybriD ModeTM.
  • The ability of s‑SNOM measurements in the visible spectral range (optional).
Overview product

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