"Pace Technologies Metallographic products available for live demonstration (GIGA-S Vibratory Polisher / NANO FEMTO Auto Grinder Polisher / PICO Precision Cutter) – Book your session today!"  /   "Hitachi High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus"  /  


“We’re excited to announce our collaboration with   Rigaku Corporation for their product verticals featuring Thermal Analysis (TA) & 3D X‑Ray Computed Tomography (3D X‑CT) technologies”
“We are proud to announce our new channel partnership with  Polytec GmbH for their Optical 3D Surface Profilers!”

Forevision Instruments solutions for Nano-Technology & Microscopy

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FE-SEM (Field Emission Scanning Electron Microscopes)

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Hitachi High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus

The SU3900SE/SU3800SE Series Microscopes are FE-SEMs that offer high-resolution observation capabilities. They combine easy data acquisition through simple operation with much larger and heavier specimens than existing FE-SEMs. This makes it possible to observe large and heavy specimens including industrial materials such as iron and steel, automotive parts, and aerospace-related parts.

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Ultrahigh-Resolution Scanning Electron Microscope SU8600

The SU8600 is a new innovative product of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM line-up. Hitachi’s high-brightness cold field emission source provides ultrahigh-resolution images even at Ultra-low voltages. A new Smart Detection System for Low Voltage BSE Imaging. Fast BSE Imaging capability with New Out-Column Crystal Type BSED (OCD).

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Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700

The SU8700 is a new innovative product of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM line-up. Hitachi’s Schottky emitter provides ultrahigh-resolution images and ultrafast microanalysis with high probe current. Display and save 6 signals simultaneously in order to acquire more information in less time.

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Ultra-high Resolution Scanning Electron Microscope - Regulus Series

Regulus series combine cold FE electron source and semi in-lens objective lens for ultrahigh resolution imaging of large samples. Depending on sample size and analytical purpose, 4 models with different stage are available….

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Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000

The SU7000 is designed to allow simultaneous acquisition of multiple secondary and backscattered electron signals, and enables rapid capture of many types of signals. With the ability to display and store up to 6 signal channels simultaneously, the SU7000 offers unsurpassed imaging performance. In addition, it provides a flexible of specimen chamber and vacuum system to support the broad range of observational conditions. Moreover, the electron gun—with its built-in Schottky emitter—can provide irradiating beam currents of up to 200 nA. The SU7000 is built to accommodate the full diversification of future analytical methods…

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