"Pace Technologies Metallographic products available for live demonstration (GIGA-S Vibratory Polisher / NANO FEMTO Auto Grinder Polisher / PICO Precision Cutter) – Book your session today!"  /   "Hitachi High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus"  /  


“We’re excited to announce our collaboration with   Rigaku Corporation for their product verticals featuring Thermal Analysis (TA) & 3D X‑Ray Computed Tomography (3D X‑CT) technologies”
“We are proud to announce our new channel partnership with  Polytec GmbH for their Optical 3D Surface Profilers!”

Forevision Instruments solutions for Nano-Technology & Microscopy

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TopMap surface profilers

Polytec offers complete optical surface metrology solutions for quality inspections of engineered surfaces and form evaluation – whether flatness or step-height on CNC-machined precision parts, warpage and form on smooth optics, or texture, finish or MEMS and microstructure analysis.

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TopMap Micro.View®

Table-top optical surface profiler

  • Non‑contact 3D measurement of surface roughness and texture
  • Application-specific objectives NEW! 0.6X to 111X
  • 100 mm large Z measuring range with CST Continuous Scanning Technology

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TopMap Micro.View®+

Next generation optical surface profiler for surface finish, surface roughness and microstructures

  • Micro.View®+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances
  • High-end white-light interferometer with nm resolution
  • Build your custom profiler (stages, objectives, stands, vibration isolation, spacers etc) with the modular setup

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TopMap Metro.Lab

Areal surface and form characterization for smaller budgets

  • Non-contact due to the optical, interferometric measurement principle
  • Large measurement field of up to approximately 80 x 80 mm with the enhanced version
  • Suitable for almost all surfaces, even those with very different reflectivities, due to Smart Surface Scanning

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TopMap Pro.Surf

Measure form parameters like flatness, parallelism or step-height of big samples faster with large FOV

  • Quick and precise 3D surface characterization
  • Capture large or multiple samples in one shot with exceptionally large workspace XYZ 230 x 220 x 70 mm
  • SST Smart Scanning Technology + filter free master any surfaces, materials and reflectiveness

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TopMap Pro.Surf+

Combined measurement of surface form + roughness with multi-sensor surface profilometer

  • Pro.Surf+ offers combined measurements of form parameters such as flatness, step height, parallelism plus additional roughness evaluation.
  • Pro.Surf+ offers combined measurements of form parameters such as flatness, step height, parallelism plus additional roughness evaluation.
  • Multi-sensor system to capture all surface and structural details

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Application Areas

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    Automotive

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    Steel, Aluminium & Metals

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    Ultra Precision Machining (UPM)

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    Data Storage

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    Microtechnology & Nanotechnology

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    Biology & Medicine

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    Glass and transparent materials

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    Electronics, Semiconductors & Solar

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