"Pace Technologies Metallographic products available for live demonstration (GIGA-S Vibratory Polisher / NANO FEMTO Auto Grinder Polisher / PICO Precision Cutter) – Book your session today!"  /   "Hitachi High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus"  /  

“We’re excited to announce our collaboration with   Rigaku Corporation for their product verticals featuring Thermal Analysis (TA) & 3D X‑Ray Computed Tomography (3D X‑CT) technologies”
“We are proud to announce our new channel partnership with  Polytec GmbH for their Optical 3D Surface Profilers!”

Forevision Instruments solutions for Nano-Technology & Microscopy

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Home / Surfmera (Formerly NT-MDT)

SURFMERA

Surfmera presents Atomic Force Microscopes and other AFM researching systems that allow to explore and characterize the physical properties of samples with nanoscale resolution.

STAvesta

SURFMERA PROXIMA

Cutting-edge atomic force microscope for large and multiple samples

  • Fully automated high-resolution measurement of large samples up to 200x200x40 mm with 1µm positioning accuracy
  • Intelligent automated selection system to define scanning parameters in one click
  • Industry best Z noise of 30pm in closed loop

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STAvesta

SURFMERA AXIS

Core of your Nano Lab

  • Exceptional noise level of down to 15 pm
  • Thermal drift at the level of < 0.2 nm/min
  • Closed loop sensors for accurate, reliable data with atomic resolution

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STAvesta

SURFMERA AXIS LUMINA

AFM & Optics synergy for Small Sample 40 mm

  • Optimized for Raman, TERS, SNOM
  • AFM-Raman in different conditions: controlled atmosphere, air, liquid, variable
  • Quantitative nanomechanics in real time in Hybrid mode temperature

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STAvesta

SURFMERA AXIS INFRA

AFM&IR harmony at nano-scale for small sample 40 mm. Available in 2026 – pre-order now.

  • Surfmera Infra is a scattering scanning near-field optical microscope (s-SNOM) developed for infrared (IR) spectral range
  • The optical system focuses on the AFM probe which excites sample structure by IR laser and collects the optical response. Then collected light is directed to Michelson interferometer for optical analysis.

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STAvesta

SURFMERA SPARK

Effective AFM for Small Sample 12 mm. Optimal for education institutions

  • Equipped with a a high-precision 100-micron closed-loop XYZ piezotube scanner
  • All the basic AFM techniques in cmpact SPM design

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